Three-dimensional total internal reflection microscopy.
نویسندگان
چکیده
We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.
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ورودعنوان ژورنال:
- Optics letters
دوره 26 14 شماره
صفحات -
تاریخ انتشار 2001